Facilities Available under CIF
A. Spectroscopy :
- Inductively Coupled Plasma- Optical Emission Spectroscopy(ICP-OES)
- FAR-MID-NIR FTIR Spectrometer
- UV -VIS
- Particle Size Analyser
- Raman Spectrometer
- Nuclear Magnetic Resonance NMR-400
- Energy Dispersive X-ray Spectroscopy
B. Microscopy :
- Optical Microscopy
- Scanning Electron Microscopy
- Atomic Force Microscopy
- Field Emission Scanning Electron Microscope
C. Mass Spectrometry :
- Liquid Chromatography – Mass Spectrometer ( LC-MS)
- High Performance Thin Layer Chromatography - Mass Spectrometer (HPTLC-MS)
- Inductively Coupled Plasma – Mass Spectrometer (ICP-MS)
D. Chromatography:
- Gel Permeation Chromatography
- Ion Chromatography
- Flash Chromatography
- High Pressure/Performance Liquid Chromatography
- High Performance Thin Layer Chromatography
- Preparative High Pressure/Performance Liquid Chromatography
E. Thermal Analysis :
- Differential Scanning Calorimeter
- Thermogravimetric Analyser
- Simultaneous TGA-DTA-DSC
- Modulated DSC
- Thermal Conductivity Analyser
F. Elemental Analysis :
- CHNSO - Elemental Analyser
G. X-RAY Diffration :
- XRD - SmartLab 9kW
- XRD - Single Crystal
H. Other Facilities / Equipments :
- Pulse Analyser
- Color Measurement System
- Porosity Meter
- BET Surface Area Analyser
- Rheometer
- Tribometer
- Surface Tensiometer
- Microwave Digestion System
- Electrochemical Analyser
- Universal Tensile Testing Machine
- Vibration Analyser
- Machinery Fault Simulator
- Optical Contact Angle Measurement System
- Usual Sample preparation accessories associated with available instruments
I. Water and Soil Analysis :
- Ion Analyser
- Anodic Stripping Voltammetry
- Flame Photometer
- pH meter
- Incubator
- Turbidity meter
- Conductivity meter
- Colorimeter
- COD reactor
- Hot Air Oven
- Centrifuge
- Magnetic Stirrer