Reviewed manuscript of the following international journals:
- IEEE Transactions on Circuits and Systems II: Brief
- IEEE Transactions on Circuits and Systems I: Regular Papers
- IEEE Transactions on Device and Materials Reliability
- IEEE Transactions on Magnetics
- IEEE Transactions on VLSI Systems
- IEEE Access
- Nanotechnology (of IOP publishing)
- IET Circuits, Devices & Systems
- Electronics Letters (of IET)
- Micro & Nano Letters (of IET)
- Microelectronics Reliability (of Elsevier)
- Microelectronics Journal (of Elsevier)
- Integration, the VLSI Journal (of Elsevier)
- International Journal of Electronics (of Taylor & Francis)
- International Journal of Electronics Letter (of Taylor & Francis)
- International Journal of Circuit Theory and Applications (of Wiley)
- Circuits, Systems & Signal Processing (of Springer)
- Frontiers of Information Technology & Electronic Engineering (of Springer)
- International Journal of Instrumentation Technology (of Inderscience Publishers)
- International Journal of Nano and Biomaterials (of Inderscience Publishers)
- Jurnal Teknologi
- Journal of Engineering Science and Technology (Taylor's University)