| S. No. |
Name of the Instrument |
| 1 |
Raman Spectrometer |
| 2 |
Nano Indenter |
| 3 |
RF Sputtering System (Thin film deposition of Carbon, Copper, Aluminium, Titanium, HfC, TiAl) |
| 4 |
RF/DC Magnetron Co-Sputtering System |
| 5 |
DC Magnetron Sputtering System |
| 6 |
Anodic Vacuum Arc (Thin film deposition of Copper, Iron, Nickel, Cobalt, Aluminium) |
| 7 |
Thermal CVD System (Growth of CNT & Graphene) |
| 8 |
Nitriding System (Only for SS Samples) |
| 9 |
DC-PECVD System |
| 10 |
RF-PECVD System (Deposition of DLC Films) |
| 11 |
Microwave PECVD System (Deposition of NCD & DLC Films) |
| 12 |
Atmospheric Pressure Plasma Jet |
| 13 |
Plasma Arc Generator (Torch) |
| 14 |
Cryogenic Setup (Min 10 K) |
| 15 |
UV-Vis Spectrometer |
| 16 |
Ferroelectric Loop Tracer |
| 17 |
Ball Milling |
| 18 |
Sample Polishing Machine |
| 19 |
Workstation |
| 20 |
Lock-in Amplifier |
| 21 |
Digital Storage Oscilloscope (4 Channel) |
| 22 |
Source Meter (2 Nos.) |
| 23 |
Triple Output Power Supply |
| 24 |
Cryogenic Setup |
| 25 |
Electromagnet (2 Tesla) |
| 26 |
Vacuum Furnace |
| 27 |
Box Type Furnace (Max. 1200 °C) |
| 28 |
High Temperature Box Furnace (Max. 1700 °C) |
| 29 |
High Temperature Box Furnace (Max. 1700 °C) |
| 30 |
Tube Furnace (Max. 1700 °C) |
| 31 |
Photoluminescent Spectrometer (Perkin Elmer) |
| 32 |
D33 Meter (APC, USA) |
| 33 |
Optical Emission Spectroscope |
| 34 |
Transferred Arc Plasma Reactor |
| 35 |
High Voltage DC Power Supply (Up to 30kV) |
| 36 |
Hot Air Oven |
| 37 |
Keithley Multimeter |
| 38 |
Solar Radiation Meter |
| 39 |
Dell Workstation |
| 40 |
Oscilloscope 20MHz |
| 41 |
Millikan’s Oil Drop Experiment Setup |
| 42 |
Thomson’s e/m Experiment Setup |
| 43 |
Travelling Microscope |
| 44 |
Function Generator |
| 45 |
Four Probe Setup |
| 46 |
Spectrometer |
| 47 |
GM Tube, Counter and Accessories |
| 48 |
Kerr Effect Setup |
| 49 |
Diode Laser |
| 50 |
Zeeman Effect Setup |
| 51 |
Photoelectric Effect Setup |
| 52 |
Laser Source with Power Supply |
| 53 |
1mW & 30mW He-Ne Laser with Power Source |
| 54 |
Optical Spectrum Analyser |